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Readout noise and time |
The following figure shows the total readout time versus readout noise of several different CCDs. The time includes both transferring charges and sampling signals. We change the integration time of our correlated double sampling circuit. SITe looks pretty slow but we obtained tail after X-ray events when we reduced the width of the clocking more. Further investigation is necessary about SITe.
Quantum efficiency(QE) |
The following figure shows the RELATIVE comparison of four types of CCDs. We set the peak value of the MIT(high-rho) at 1.0. The estimated error of the measurement is +-2%. See the discussion here regarding the error. All the data were measured here at the detector lab except W62C2 which was measured at Lick observatory. Because W6C1 was tested both here and Lick, we compared the results. The shapes of QE agreed very well and our relative QE value is 10% larger than the Lick's QE value. Therefore, a factor of 1.1 was multiplied to the QE of W62C2 measured at Lick when plotted in the figure for reference.

Non-uniformity of QE
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The degree of no-uniformity which is defined by the (max - min)/mean in small area (which covers several black and white region) are the following,
| W58C2 | 45 % at 360 nm | 0.9 % at 960 nm |
| W6C1 | 31 % at 350 nm | 0.6 % at 960 nm |
SITe |
Under blue light, SI001S shows small dots whose diameter are approximately 100 micron. The dots has 7% less light response. The following image shows how they look like (a part of 350 nm image). They disappear over 640 nm.
EEV |
EEV001S also shows non-uniformity at 350 nm probably due to the laser stepping pattern. The (max-min)/mean is about 7 %.
Part of EEV001S image under 350 nm light (1000X1000)
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Last update: 98/07/17
Satoshi MIYAZAKI satoshi@anela.mtk.nao.ac.jp